It is critical to characterize the chemical composition of the material surface. Alfa Chemistry offers X-Ray Fluorescence Spectroscopy (XRF), an elemental analysis tool that can swiftly and semi-quantitatively screen the elemental composition of samples to discover trace chemical compounds. On their way to the detector, the distinctive X-ray photons created in the sample have a certain energy and are absorbed by other atoms in the sample. The amount of information available is determined by the energy of the element of interest and the sample type (average atomic number). The depth is measured in micrometers and centimeters.
Learn About X-Ray Fluorescence Spectroscopy
When incident X-rays generate electron excitation, the electron excitation produces fluorescence with the characteristic energy of each element when it relaxes, as seen in XRF technology. XRF can provide useful information about the trace level of the chemical component of interest and assist in the identification of a large number of samples by performing rapid quantitative and semi-quantitative analyses of the elemental composition of the elements in a sample. Solid, liquid, slurry, and loose powder samples are all available.
All of these can be determined using one of two XRF techniques: Energy Dispersive XRF (EXDRF) or Wavelength Dispersive XRF (WDXRF). Although the former has certain speed and portability advantages, the latter has better accuracy and sensitivity, as well as the capacity to detect a wide range of elements, from parts per million to Na-U in weight % concentrations.
The following are only a few of the benefits of employing XRF for surface chemical investigation of materials:
- The chemical composition of many sample types can be determined using XRF.
- XRF is also useful for determining the thickness and composition of layers and coatings, as well as for quick screening (semi-quantitative).
- XRF can detect elements ranging from beryllium (Be) to americium (Am) at concentrations ranging from 100 wt% to sub-ppm.
- XRF analysis does not necessitate the use of acids or chemicals.
- XRF is a non-destructive technique. After the measurement, the sample is still intact.
XRF, on the other hand, has its restrictions. XRF can't tell the difference between different oxides. A viable method would be XRD. XRF cannot be utilized to quantify elements at lower ppb or ppt concentration levels, even with a longer measurement time. However, XRF is a great approach for determining the chemical composition of surfaces in general.
X-Ray Fluorescence Spectroscopy of Alfa Chemistry
Alfa Chemistry chose WDXRF for the elemental analysis to provide our customers with the most accurate and quick screening of various elements in diverse sample types. All elements in the sample are excited at the same time in the WDXRF spectrometer. The analytical crystal or monochromator diffracts the different energy of the characteristic radiation emitted from the sample in different directions.
The following are some of the benefits of WDXRF spectrometry:
- High-resolution image, ideal for light elements
- Low detection threshold, which is ideal for light elements.
- Stable analysis
- High throughput
We use XRF technology and there are some other potential uses:
- Supplement other analytical techniques, such as X-ray diffraction
- Use crystal monochromator (WDXRF) to resolve fluorescence wavelength to accurately identify elements
- By generating calibration curves, these calibration curves are prepared according to synthetic standards that match the samples, so as to generate precise and accurate quantitative element results in specific materials.
Alfa Chemistry can handle all of your XRF analytical demands as your entire quality assurance partner. Please get in touch with us if you'd like to learn more.
