The infrared spectrum is the part of the electromagnetic spectrum that deals with the infrared area. It encompasses a wide range of methods, the majority of which are based on absorption spectroscopy. Near-infrared, mid-infrared, and far-infrared are the three sections of the infrared component of the electromagnetic spectrum. Higher near-infrared radiation, around 14000~4000 cm-1, can cause overtone or harmonic vibration. Basic vibration and associated rotational vibration structures can be studied using mid-infrared wavelengths of 4000~400 cm-1. Far infrared rays, which have a wavelength of 400~10 cm-1 and have low energy, are found near the microwave area and can be used to rotate the spectrum.
It may be used to detect and research compounds, just like any other spectroscopic technique. A Fourier Transform Infrared (FTIR) spectrometer is a common laboratory device that employs this technology. FTIR spectroscopy can define, identify, and quantify a wide range of materials, making it valuable in a variety of fields.
In the research laboratory, Alfa Chemistry uses a variety of FTIR instruments and can run samples with minimal sample preparation. Please contact Alfa Chemistry for more information on our FTIR facilities and their capabilities.
Bruker Tensor 27 FTIR with HYPERION II Microscope
The spectrometer is capable of collecting spectra in the MIR range (7000~600 cm-1). It can capture spectra in a single point, mapping, or imaging mode when connected to the Hyperion microscope. For attenuated total reflection (ATR) and grazing angle (GA) investigations, special objectives can be utilized.
The system includes the following features in addition to typical transmission and reflection measurements:
- Attenuated Total Reflection (ATR) - It is a technique for analyzing materials with high absorptivity and can reveal information about the material's surface properties.
- Sweep Angle (GA)- It guides infrared light through the sample surface at an angle of 84°, enhancing the sample's path length and sensitivity, making it excellent for microanalysis of thin coatings on metal substrates, even as thin as a single layer thickness.
VERTEX 80v FT-IR Spectrometers
This is a top-of-the-line research-grade FTIR equipment capable of collecting spectra in the NIR (15500~4000 cm-1), MIR (12000~850 cm-1), and FIR (680~50 cm-1) spectral regions. The vacuum pump allows the optical platform to be emptied, reducing infrared active atmospheric water and carbon dioxide absorption dramatically.
This spectrometer can be used with the sample accessories for analysis using the following methods:
- Diffuse Reflection - Suitable for non-reflective materials and irregular surfaces or coatings.
- Specular Reflectance - Used to study film thickness, material reflectivity, and the uniformity and homogeneity of surface coatings.
- Attenuated Total Reflection (ATR) - Used for materials with strong absorption, can provide information about the surface characteristics of the material.
SNOM Microscopele (Bio AFM)
Materials, surfaces, and biological materials can have their morphology, mechanical characteristics, and infrared spectrum information provided by the instrument (cells, tissues, extracellular vesicles, etc). It has a resolution of less than 10 nm, making it ideal for perfect samples. A NeaSNOM microscope with a nano-imaging module and a nano FTIR spectroscopy module make up the system.
The x-y scanner can acquire AFM and near-field images up to 100 µm x 100 µm with a positioning resolution of 0.4 nm, and the instrument can handle materials up to 40 x 50 x 8 mm in size.
Bruker MPA Near Infrared Spectrometer
The instrument was created to analyze samples in the near-infrared (NIR) range (12500~3600 cm-1). It has a high level of sensitivity and consistency. It can analyze liquids, solids, powders, pastes, and tablets thanks to a range of sample methods. Even without transferring to the sample container, the fiber optic probe accessory permits immediate measurement of samples. Transmission measurement of multiple liquid vials or solid tablets can also be performed using an automatic sample wheel.
