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- Inductively Coupled Plasma-Mass Spectrometry for Surface Trace Metal Analysis
Trace metal analysis detects, identifies, and quantifies low-level metals in a variety of materials and samples, which is critical for coating product development and quality control. Detecting trace metals in samples can also aid in the identification of pollutants and provide valuable information for process optimization and chemical product formulation development.
When working at the trace level, the analytical instrument's quality, performance, and sensitivity are crucial. Alfa Chemistry's scientists are experts at using inductively coupled plasma mass spectrometry to accurately quantify trace elements and diverse matrices (ICP-MS). Trace metal analysis services provide comprehensive quality assurance for coated products, with detection thresholds of parts per million (ppm), parts per billion (ppb), and parts per trillion (ppt).
ICP-MS is a technique for determining low concentration (range: ppb = parts per billion = µg/l) and ultra-low concentration elements (range: ptt = parts per trillion = nanograms/liter). The atomic elements are guided through the plasma source, where they are ionized. Then, these ions are classified according to their mass. The advantages of ICP-MS technology over Atomic Absorption Spectroscopy (AAS) or Inductively Coupled Plasma Optical Emission Spectrscopy (ICP-OES ) are: extremely low detection limit; large linear range; possibility of detecting element isotope composition.
Fig 1. Cross section schematic of an ICP-MS. (Wilschefski S. C, et al. 2019)
In general, ICP-OES is the chosen measuring method for trace metal analysis. However, in cases where ultra-trace quantification is required, ICP-OES cannot provide the necessary sensitivity. ICP-MSdetection are required at this time. Furthermore, the traditional quadrupole-based ICP-MS measurement may be interfered by the spectrum, making them difficult or even inaccurate.
Alfa Chemistry uses high-resolution ICPMS or magnetic sector ICPMS to detect, identify, and quantify heavy analytes in samples to tackle these difficulties. This high-end analytical capacity allows for a precise measurement of ultra-trace metal concentration in a variety of materials, which is useful in situations where ultra-trace metal contamination is a concern.
We use a variety of sample preparation technologies, including microwave digestion technology, that are most appropriate for relevant materials. We have experience developing and validating methods for a variety of sample types. We can also provide specialized single-element or multi-element analysis services, as well as heavy metal multi-analyte analysis packages (mercury, cadmium, arsenic, and lead).
The benefits of using our high resolution ICP-MS analysis technology include but are not limited to:
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