Atomic Force Microscopy (AFM) is a high-resolution scanning probe microscope that can image and analyze material surfaces with micrometer to nanoscale resolution. A very sharp micrometer tip mounted on a cantilever spring scans the sample in AFM. The deflection of the cantilever can be used to measure the interaction between the tip and the sample. The laser signal focused on the tip of the cantilever and reflected on the position-sensitive photodiode is utilized to measure this. A topographical map of the sample can be generated by charting the cantilever's deflection in relation to its position on the sample.
Surface and interface forces can also be measured using AFM. The substrate can move up and down the grating through the voltage level changing step if the cantilever and sample are kept in a fixed lateral position, and the cantilever can move up and down by applying voltage. When approaching a fixed horizontal contact, the sample usually attracts the tip, generating a "jump-in" deflection. The piezoelectric input then continues to move the sample until it reaches the platform height preset setting.
The platform is then turned around, and the sample and tip are separated. Because the separation happens only when the cantilever's restoring force exceeds the interaction force between the tip and the sample, the cantilever's negative deflection under non-contact output can be utilized to quantify the interaction force according to Hooke's law.
The interaction force between the material and a certain substrate can be determined by attaching the functional material of interest to the AFM cantilever and employing this "functionalized" probe for force measurement. This allows for the analysis of a huge number of systems on a particle-by-particle or even molecular-by-molecular basis.
Our Atomic Force Microscope Facilities
Bruker Dimension 3100 Atomic Force Microscope
This AFM device is ideal for basic imaging and force investigations. Its open access to tips and samples can accommodate large or irregularly sized substrates.
The modes are: contact mode, tap mode; lateral force mode; phase imaging mode; magnetic force microscope (MFM); electrostatic force microscope (EFM); force volume.
Typical applications include: characterization of surface roughness; step height and topography.
Bruker MultiMode 8-HR Atomic Force Microscope
The Atomic Force Microscope (AFM) is a high-resolution, high-performance microscope with unrivaled adaptability. At the same time, the imaging speed, resolution, and nanomechanical performance are all increased thanks to the patented Bruker probe technology.
Imaging with the highest resolution - It allows scientists to create the highest detailed photographs of chemicals and biological structures on a regular basis.
Simple expert results - It provide faster and more consistent results of the highest quality for all tests.
Unlimited open access flexibility - It works with a number of attachments and can give AFM test solutions according to your needs.
